Udai Prakash, Dr. Navaid Z. Rizvi, and Herman-Al-Ayubi. “Structural Reliability of AlGaN/GaN High Electron Mobility Transistors”. Journal of Electronic Design Engineering, vol. 5, no. 1, Mar. 2019, pp. 15-28, http://matjournals.co.in/index.php/JOEDE/article/view/6695.