Design of Low Power TPG for BIST Using Reconfigurable Johnson Counter
Keywords:
Built-in-self-test (BIST), Multiple Single Input Change Vector (MSIC), Test Pattern Generator (TPG)Abstract
Worked in Self-Test assumes an essential job in testing of VLSI circuits. Test designs created utilizing design generator is utilized to test the Circuit under Test. Regular technique for test design age includes in Reconfigurable Johnson Counter and LFSR which needs in relationship between's progressive test vectors. A Modern Low Power test design is created utilizing Reconfigurable Johnson Counter and Accumulator. A Low Power utilization gadget is basic for battery worked gadgets. The system for delivering the test vectors for BIST is coded utilizing VHDL and reproductions were performed with ModelSim 10.0b.
